author= {Schlüter, Ralf and Beck, Eugen and Ney, Hermann},
title= {Upper and Lower Tight Error Bounds for Feature Omission with an Extension to Context Reduction},
journal= {IEEE Transactions on Pattern Analysis and Machine Intelligence},
pages= {502-514},
note= {DOI 10.1109/TPAMI.2017.2788434},
volume= {41},
number= {2},
year= 2019,
month= feb,
journallink= {http://www.computer.org/portal/web/tpami/},
pdf = {https://www-i6.informatik.rwth-aachen.de/publications/downloader.php?id=1062&row=pdf},
url = {http://https://ieeexplore.ieee.org/document/8242665?arnumber=8242665}